Author:
Saad Sehmi,Haddad Fayrouz,Ben Hammadi Aymen
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference98 articles.
1. International Technology Roadmap for Semiconductors (ITRS),2015
2. Layout techniques for MOSFETs;Gimenez,2016
3. Tunnel FET technology: A reliability perspective;Datta;Microelectron. Reliab.,2014
4. A review of recent MOSFET threshold voltage extraction methods;Conde;Microelectron. Reliab.,2002
5. Reliability of miniaturized transistors from the perspective of single-defects;Waltl;Micromachines,2020
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献