FPGA-based reliability testing and analysis for 3D NAND flash memory-Reference-Cited by-同舟云学术

FPGA-based reliability testing and analysis for 3D NAND flash memory

Published:2020-11 Issue: Volume:114 Page:113846
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Wei Debao,Piao Zhelong,Feng Hua,Qiao Liyan,Peng Xiyuan

Funder

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities

Heilongjiang Postdoctoral Fund

Guangxi Key Laboratory of Automatic Detecting Technology and Instruments

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. Scaling and reliability of NAND flash devices;Park,2014

2. Polycrystalline-silicon channel trap induced transient read instability in a 3D NAND flash cell string;Tsai,2016

3. Down-coupling phenomenon of floating channel in 3D NAND flash memory[J];Kim;IEEE Electron Device Letters,2016

4. Reliability challenges in 3D NAND flash memories[C];Zambelli,2019

5. 9.1x error acceptable adaptive artificial neural network coupled LDPC ECC for charge-trap and floating-gate 3D-NAND flash memories[C];Nakamura;custom integrated circuits conference,2018

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1. Combined experimental and theoretical investigation on SONOS pFLASH switch;Semiconductor Science and Technology;2023-06-12

2. Edge Word-Line Reliability Problem in 3-D NAND Flash Memory: Observations, Analysis, and Solutions;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-06