Trends of power semiconductor wafer level packaging

Author:

Liu Yong

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Numerical Study on the Influence of Polyimide Thickness and Curing Temperature on Wafer Bow in Wafer Level Packaging;2023 24th European Microelectronics and Packaging Conference & Exhibition (EMPC);2023-09-11

2. Unraveling the Heterogeneity of Epoxy-amine Networks by Introducing Dynamic Covalent Bonds;Chinese Journal of Polymer Science;2022-10-31

3. Network Formation and Physical Properties of Epoxy Resins for Future Practical Applications;JACS Au;2022-06-09

4. From Wafer Bifurcation to Warpage Die: a Correlation Method to determine the Warpage of a Metal-Coated Silicon Substrate;2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2022-04-25

5. Experimental and theoretical investigation of bifurcated wafer warpage evolution in the wafer level packaging processes;Journal of Materials Science: Materials in Electronics;2020-08-18

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