A run-time built-in approach of TID test in SRAM based FPGAs-Reference-Cited by-同舟云学术

A run-time built-in approach of TID test in SRAM based FPGAs

Published:2016-09 Issue: Volume:64 Page:42-47
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Ma Ning,Wang Shaojun,Liu Datong,Peng Yu

Funder

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities

Guangxi Key Laboratory of Automatic Detecting Technology and Instruments

China Scholarship Council

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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