Author:
Pugatschow A.,Heiderhoff R.,Balk L.J.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference15 articles.
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4. On the analysis of diffusion length measurements by SEM;Donolato;Solid State Elec,1982
5. Balk LJ, Menzel E, Kubalek E. Microcharacterization of semiconductors by cathodoluminescence (CL) and electron beam induced current (EBIC) techniques. In: Proc of Int Conf IXCOM; 1980. p. 613–24.
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