Author:
Beaudoin F.,Sanchez K.,Perdu P.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference19 articles.
1. Time-resolved optical characterization of electrical activity in integrated circuits;Tsang;Proc of IEEE,2000
2. Prospects of time-resolved photon emission as a debug tool;Vickers;ISTFA,2002
3. Resistive interconnection localization;Cole;ISTFA,2001
4. Soft defect localization (SDL) on ICs;Bruce;ISTFA,2002
5. Critical timing analysis in microprocessors using near-ir laser assisted device alteration (LADA);Rowlette;ITC,2003
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献