Author:
Baccar F.,Arbess H.,Theolier L.,Azzopardi S.,Woirgard E.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. High-voltage planar junction with a field-limiting ring;Yasuda;Solid State Electron.,1982
2. Field distribution near the surface of bevelled p–n junction in high voltage devices;Cornu;IEEE Trans. Electron Devices,1973
3. High-voltage planar devices using field plate and semi resistive layers;Jaume;IEEE Trans. Electron Devices,1991
4. Junction termination extension for the near ideal breakdown voltage in p–n junction;Temple;IEEE Electron Device Lett.,1986
5. Ultra-high voltage device termination using the 3D RESURF (super-junction) concept — experimental demonstration at 6.5kV;Udrea,2001