Investigating the reliability impacts of neutron-induced soft errors in aerial image classification CNNs implemented in a softcore SRAM-based FPGA GPU-Reference-Cited by-同舟云学术

Investigating the reliability impacts of neutron-induced soft errors in aerial image classification CNNs implemented in a softcore SRAM-based FPGA GPU

Published:2022-11 Issue: Volume:138 Page:114738
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Benevenuti Fabio,Gonçalves Marcio M.,Pereira Evaldo Carlos F.,Vaz Rafael G.,Gonçalez Odair L.,Bastos Rodrigo Possamai,Letiche Manon,Kastensmidt Fernanda L.,Azambuja José Rodrigo

Funder

Fundação de Amparo à Pesquisa do Estado do Rio Grande do Sul

Financiadora de Estudos e Projetos

Région Auvergne-Rhône-Alpes

PIA

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior

Conselho Nacional de Desenvolvimento Científico e Tecnológico

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference12 articles.

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4. Impact of scaling on the soft error sensitivity of bulk, FDSOI and FinFET technologies due to atmospheric radiation;Hubert;Integration,2015

5. Single event upsets under 14-MeV neutrons in a 28-nm SRAM-based FPGA in static mode;Fabero;IEEE Trans. Nucl. Sci.,2020

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