Poisson shock models leading to new classes of non-monotonic aging life distributions-Reference-Cited by-同舟云学术

Poisson shock models leading to new classes of non-monotonic aging life distributions

Published:2011-12 Issue:12 Volume:51 Page:2412-2415
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Pandey Aniruddha,Mitra Murari

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference15 articles.

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3. On age replacement and the total time on test concept;Bergman;Scand J Statist,1979

4. Shock models with NBUE survival;Block;J Appl Probab,1978

5. Bray T, Crawford G, Proschan F. Maximum likelihood estimation of a U-shaped failure rate function. Math Note 534. Seattle, W.A.: Boeing Scientific Research Laboratories; 1967

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