Multipole WIEN-filter for a high-resolution X-PEEM-Reference-Cited by-同舟云学术

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Multipole WIEN-filter for a high-resolution X-PEEM

Published:1997-03 Issue:1-3 Volume:84 Page:251-261
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Marx G.K.L,Gerheim V,Schönhense G

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. E. Bauer, Ultramicroscopy 12 (1985) 51.

2. W. Telieps, E. Bauer, Ultramicroscopy 17 (1985) 57.

3. E. Bauer, T. Franz, C. Koziol, G. Lilienkamp, T. Schmidt, in: R. Rosei (Eds.), Chemical, Structural and Electronic Analysis of Heterogeneous Surface on Nanometer Scale, Kluwer, Dordrecht, 1995.

4. H. Rose, Optik 77 (1987) 26.

5. M. Scheinfein, Optik 82 (1989) 99.

Cited by 39 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Soft X-ray spectroscopy of light elements in energy storage materials;Energy Storage Materials;2021-09

3. Notes and References;Principles of Electron Optics;2018

4. Synchrotron Radiation Photoemission Electron Microscopy;Encyclopedia of Surface and Colloid Science, Third Edition;2015-12-04

5. Scanning X-Ray Photoelectron Microscopy (SXPEM);Encyclopedia of Surface and Colloid Science, Third Edition;2015-12-04

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