A photoemission microscope with a hemispherical capacitor energy filter-Reference-Cited by-同舟云学术

A photoemission microscope with a hemispherical capacitor energy filter

Published:1997-03 Issue:1-3 Volume:84 Page:211-229
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Tonner B.P,Dunham D,Droubay T,Pauli M

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference35 articles.

1. B.P. Tonner, Nucl. Instrum. Methods A291 (1990) 60–66.

2. H. Ade, J. Kirz, S. Hulbert, E. Johnson, E. Anderson, D. Kern, Appl. Phys. Lett. 56 (1990) 1841.

3. R.L. Chaney, Surf. Interface Anal. 10 (1987) 36.

4. B.P. Tonner, D. Dunham, T. Droubay, J. Kikuma, J. Denlinger, E. Rotenberg, A. Warwick, J. Electron Spectrosc. Relat. Phenom. 75 (1995) 309–332.

5. R. Castaing, G. Slodzian, J. Phys. E 14 (1981) 1119.

Cited by 52 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Vector Potential Photoelectron Microscopy Instrument Design;Ultramicroscopy;2020-08

2. Synchrotron Radiation Photoemission Electron Microscopy;Encyclopedia of Surface and Colloid Science, Third Edition;2015-12-04

3. Scanning X-Ray Photoelectron Microscopy (SXPEM);Encyclopedia of Surface and Colloid Science, Third Edition;2015-12-04

4. Photoelectron Emission Microscopy of Surfaces;Encyclopedia of Surface and Colloid Science, Third Edition;2015-12-04

5. Instrumentation;Surface Microscopy with Low Energy Electrons;2014