The interface states and series resistance analyzing of Au/SiO2/n-GaAs at high temperatures
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials
Reference32 articles.
1. Single and Multiple Oxygen Vacancies in Ultrathin $ \hbox{SiO}_{2}$ Gate Dielectric and Their Influence on the Leakage Current: An Ab Initio Investigation
2. Effect of series resistance and interface states on the I–V, C–V and G/ω–V characteristics in Au/Bi-doped polyvinyl alcohol (PVA)/n-Si Schottky barrier diodes at room temperature
3. Anomalous Peak in the Forward-Bias C–V Plot and Temperature-Dependent Behavior of Au/PVA (Ni,Zn-doped)/n-Si(111) Structures
4. Temperature dependence of I-V and C-V characteristics of Ni/n-CdF2 Schottky barrier type diodes
5. Series resistance influence on intersecting behaviour of inhomogeneous Schottky diodes I–V curves
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