Author:
Brent Robert N.,Wines Hunter,Luther Joseph,Irving Nathan,Collins Joshua,Drake Brandon L.
Funder
DuPont Company
James Madison University Department of Integrated Science and Technology
Department of Geology
Madison Art Collection
Subject
Process Chemistry and Technology,Pollution,Waste Management and Disposal,Chemical Engineering (miscellaneous)
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5. On-site analysis of heavy metal contaminated areas by means of total reflection X-ray fluorescence analysis (TXRF);Stosnach;Spectrochim. Acta Part B: Atomic Spectrosc.,2006
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