An electron beam test system linked with a CAD database-Reference-Cited by-同舟云学术

An electron beam test system linked with a CAD database

Published:1987-01 Issue:2-4 Volume:7 Page:267-274
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Komatsu F.,Miyoshi M.,Sano T.,Okumura K.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Automated Fault Diagnostic EB Tester and its Application to a 40K-gate VLSI Circuit;Tamama,1985

2. FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits;Kuji;IEEE Transactions on Computer-Aided Design,1986

3. An automated E-beam tester with CAD insterface, “Finder: A powerful tool for fault diagnosis of ASIC”;Kuji,1986

4. Fully automated electron beam tester combined with CAD database;Tamama,1986

5. A Fully-Automated Electron Beam Test System for VLSI Circuits;Kuji;IEEE Design & Test,1985

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1. Principles and Applications;Electron Beam Testing Technology;1993

2. A diagnostic assistant for integrated circuit diagnosis;Microelectronic Engineering;1992-03

3. Model-based reasoning for electron-beam debugging of VLSI circuits;Journal of Electronic Testing;1991-11

4. Modular CAD environment for contactless test systems;Microelectronic Engineering;1990-05

5. Fundamentals of electron beam testing via capacitive coupling voltage contrast;Microelectronic Engineering;1990-05