CHARACTERIZATION OF THIN FILMS BY X-RAY DIFFRACTION-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

CHARACTERIZATION OF THIN FILMS BY X-RAY DIFFRACTION

Published:1985 Issue: Volume: Page:325-351
ISSN:
Container-title:Thin Films from Free Atoms and Particles
language:
Short-container-title:

Author:

Segmüller Armin,Murakami Masanori

Publisher

Elsevier

Reference94 articles.

1. “Handbook of Thin Film Technology”;Mader,1970

2. “Epitaxial Growth, Part A”;Vook,1975

3. “X-Ray Crystallography,”;Buerger,1942

4. “X-Ray Diffraction Procedures,”;Klug,1954

5. “Elements of X-Ray Diffraction,”;Cullity,1956

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of Precursor on Microstructure and Phase Composition of Epitaxial Hydrothermal PbZr0.7Ti0.3O3 Films;Chemistry of Materials;2003-02-14

2. Semiconductors: Integrated Circuit Manufacture;Industrial Applications of X-Ray Diffraction;1999-09-22

3. Internal Stress In Sputtered Silver Nickel Thin Films And Multilayers: Sputtering Pressure And Thickness Effects;MRS Proceedings;1999

4. Optimizing diamond growth for an atmospheric oxyacetylene torch;Journal of Materials Research;1997-05

5. Mechanical aspects of multichip module reliability;JOM;1992-07

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP