Fresnel diffraction in a coherent convergent electron beam
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. Adjustment of a STEM instrument by use of shadow images
2. Coherent interference in convergent-beam electron diffraction and shadow imaging
3. Scanning Electron Microscopy;Cowley,1980
4. Innovative imaging and microdiffraction in stem
5. Forty Years of History of a Grating Interferometer
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1. Ondrej Krivanek's early scientific research;Ultramicroscopy;2017-09
2. Ultra-high resolution electron microscopy;Reports on Progress in Physics;2016-12-23
3. Electron nanodiffraction;Microscopy Research and Technique;1999-07-15
4. Shadow images for in-line holography in a STEM instrument;Microscopy Research and Technique;1995-02-01
5. Principles and applications of convergent beam electron diffraction: A bibliography (1938-1990);Journal of Electron Microscopy Technique;1991-01
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