Surface structural sensitivity of convergent-beam RHEED: Si (001) 2×1 models compared with dynamical simulations-Reference-Cited by-同舟云学术

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Surface structural sensitivity of convergent-beam RHEED: Si (001) 2×1 models compared with dynamical simulations

Published:2000-04 Issue:3-4 Volume:81 Page:235-244
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Zuo J.M.,Weierstall U.,Peng L.M.,Spence J.C.H.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference36 articles.

1. W.N. Unertl, Physical Structure, Handbook of Surface Science, Vol. 1, North-Holland, Amsterdam, 1996.

2. Rheed intensity analysis of Si(111)7 × 7 at one-beam condition

3. Dynamical analysis of a RHEED pattern from the Si(111)-7 × 7 surface

4. STRUCTURE ANALYSIS OF ${\rm Si}(111)(\sqrt{3}\times\sqrt{3}$)–Al BY ENERGY-FILTERED RHEED

5. Analysis of RHEED data from the GaAs(001)2 × 4 surface

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1. An advanced three-dimensional RHEED mapping approach to the diffraction study of Co/MnF2/CaF2/Si(001) epitaxial heterostructures;Journal of Applied Crystallography;2016-08-24

2. A coherent photofield electron source for fast diffractive and point-projection imaging;Philosophical Magazine;2010-12-14

3. Convergent-Beam Low Energy Electron Diffraction (CBLEED) and the Measurement of Surface Dipole Layers;Microscopy and Microanalysis;2004-01-22

4. New approaches to the imaging of surface potentials;Journal of Physics: Condensed Matter;2001-11-12

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