Topographic and phase-contrast imaging in atomic force microscopy
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy
2. K.L. Babcock, C.B. Prater, Phase imaging: beyond topography. Application notes (AN11), Digital Instrument, 1995.
3. The Effects of the Preparation Conditions and Heat-Treatment Conditions of Pt/Ti/SiO2/Si Substrates on the Nucleation and Growth of Pb(Zr,Ti)O3Films
4. O. Auciello, J. F. Scott, R. Ramesh, Phys. Today (1998) 22.
5. Machining Oxide Thin Films with an Atomic Force Microscope: Pattern and Object Formation on the Nanometer Scale
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