1. Fabrication of optical fiber probes for nanometer‐scale dimensional metrology
2. Scanning force microscope as a tool for studying optical surfaces
3. J. Schneir, M.C. Sweenew, T. H. McWaid, Fourth Workshop on Industrial Applications of Scanning Probe Microscopy, NIST Gaithersburg, MD, USA, 1997, pp. 30–31.
4. W. Morris, Technical Program, Fourth Workshop on Industrial Applications of Scanning Probe Microscopy, NIST Gaithersburg, MD, USA, 1997, pp. 18–19.
5. Semiconductor Industry Association, National Technology Roadmap for Semiconductors, 1997.