A scatterometer for measuring the polarized bidirectional reflectance distribution function of painted surfaces in the infrared-Reference-Cited by-同舟云学术

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A scatterometer for measuring the polarized bidirectional reflectance distribution function of painted surfaces in the infrared

Published:2008-10 Issue:6 Volume:51 Page:559-563
ISSN:1350-4495
Container-title:Infrared Physics & Technology
language:en
Short-container-title:Infrared Physics & Technology

Author:

Weiwei Feng,qingnong Wei

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Geometrical Considerations and Nomenclature for Reflectance;Nicodemus,1977

2. Directional reflectance characterization facility and measurement methodology;McGuckin;Appl. Opt.,1996

3. Measurement method of absolute bidirectional reflectance distribution function;Wei;Acta Optica Sinica,1996

4. Experimental study on bidirectional reflectance distribution function of laser scattering from various rough surfaces;Wu;Acta Optica Sinica,1996

5. Analysis of scattering characteristic of the sample based on BRDF experiment measurements;Zhang;Opt. Tech.,2006

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3. Investigating directional reflection characteristics of anisotropic machined surfaces using a self-designed scatterometer;Applied Optics;2019-10-07

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