Investigation of defects in BaSi2 thin film on Si prepared by co-sputtering technique

Author:

Mohmad Abdul RahmanORCID,Abdullah Huda,Kido Kazuki,Hasebe Hayato,Du Rui,Mesuda Masami,Suemasu Takashi

Funder

Japan Society for the Promotion of Science

Universiti Kebangsaan Malaysia

Publisher

Elsevier BV

Reference27 articles.

1. Properties of Crystalline Silicon Inspec, London;Hull,1999

2. BaSi2 as a promising low-cost, earth-abundant material with large optical activity for thin-film solar cells: a hybrid density functional study;Kumar;APEX,2014

3. Investigation of grain boundaries in BaSi2 epitaxial films on Si(1 1 1) substrates using transmission electron microscopy and electron-beam-induced current technique;Baba;J. Cryst. Growth,2012

4. Influence of grain size and surface condition on minority-carrier lifetime in undoped n-BaSi2 on Si(111);Takabe;J. Appl. Phys.,2014

5. Simple method for significant improvement of minority-carrier lifetime of evaporated BaSi2 thin film by sputtered-AlOx passivation;Shaalan;Mater. Sci. Semicond. Process.,2018

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