Atom probe tomography today-Reference-Cited by-同舟云学术

Atom probe tomography today

Published:2007-12 Issue:12 Volume:10 Page:36-42
ISSN:1369-7021
Container-title:Materials Today
language:en
Short-container-title:Materials Today

Author:

Cerezo Alfred,Clifton Peter H.,Galtrey Mark J.,Humphreys Colin J.,Kelly Thomas F.,Larson David J.,Lozano-Perez Sergio,Marquis Emmanuelle A.,Oliver Rachel A.,Sha Gang,Thompson Keith,Zandbergen Mathijs,Alvis Roger L.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference66 articles.

1. Atom probe field-ion microscopy;Miller,1996

2. Application of a position‐sensitive detector to atom probe microanalysis

3. The tomographic atom probe: A quantitative three‐dimensional nanoanalytical instrument on an atomic scale

4. Atom probe tomography,;Miller,2000

5. Strategies for fabricating atom probe specimens with a dual beam FIB

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