Low temperature dielectric behavior and ac conductivity in metal-containing chalcogenide GeS films-Reference-Cited by-同舟云学术

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Low temperature dielectric behavior and ac conductivity in metal-containing chalcogenide GeS films

Published:2005-01-14 Issue:1-2 Volume:176 Page:149-154
ISSN:0167-2738
Container-title:Solid State Ionics
language:en
Short-container-title:Solid State Ionics

Author:

ELSAYED S,FAYEK S

Publisher

Elsevier BV

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of Sn, in on ac electrical conductivity and dielectric relaxation behavior of Se–Te chalcogenide glass films;Indian Journal of Physics;2022-07-15

2. Dielectric relaxation processes in stoichiometric Ge:Sb:Te amorphous films;Journal of Non-Crystalline Solids;2010-10

3. Dielectric relaxation and Poole–Frenkel conduction in poly(vinyl chloride) blends with bisphenol A/Egyptian corncob resin;Journal of Applied Polymer Science;2008

4. Dielectric relaxation in ferroelectric TlInS2 layered crystals within metastable chaotic state;Crystal Research and Technology;2007-06

5. Differential scanning calorimetry and dielectric properties of methyl-2-hydroxyethyl cellulose doped with erbium nitrate salt;Carbohydrate Polymers;2006-08

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