1. A LEELS and auger study of the oxidation of liquid and solid tin
2. A. J. Bevolo. Scanning Electron Microscopy. 1985, vol. 4, p. 1449. (Scanning Electron Microscopy, Inc. Elk Grove Village, IL) Thorough exposition of the principles and applications of reflected electron energy-loss microscopy (REELM) as well as a comparison to other techniques, such as SAM, EDS and SEM.
3. Analysis of Optical- and Inelastic-Electron-Scattering Data Parametric Calculations*†
4. The observation of surface sensitive M2,3 absorption edge shifts by Reflected Electron Energy Loss Spectroscopy (REELS)