Device and circuit-level evaluation of a zero-cost transistor architecture developed via process optimization

Author:

Devoge Paul,Aziza Hassen,Lorenzini Philippe,Masson Pascal,Malherbe Alexandre,Julien Franck,Marzaki Abderrezak,Regnier Arnaud,Niel Stephan

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. Embedded high-precision frequency-based capacitor measurement system;Welter,2013

2. Fast embedded characterization of FEOL variations in MOS devices;Rigaud,2009

3. Comparison of contemporary CMOS ring oscillators;Badillo;IEEE Radio Frequency Integrated Circuits (RFIC) Systems Digest of Papers,2004

4. Ring oscillators for CMOS process tuning and variability control;Bhushan;IEEE Trans Semicond Manuf,2006

5. Frequency equation for the submicron CMOS ring oscillator using the first order characterization;Koithyar;J Semicond,2018

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