Fabrication and characterization of a novel infrared photoconductive sensor in InAlAs/InGaAs heterojunction

Author:

Zhang Yan,Cao Xin,He Zheng,Zhuang Chunquan,Chen Yifang,Fang Jiaxiong

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. 547-GHz f(t) In0.7Ga0.3As–In0.52Al0.48As HEMTs with reduced source and drain resistance;Shinohara;IEEE Electron Dev Lett,2004

2. Thayne I, Cao, X, Moran D, Boyd E, Elgaid K, McLelland H, et al. In: Fourth IEEE conference on nanotechnology, Munich, Germany, 16–19 August 2004.

3. Novel high uniformity highly reproducible non-selective wet digital gate recess etch process for InPHEMTs;Cao;Microelectron Eng,2003

4. Electron velocity overshoot effect in collector depletion layers of InP/InGaAs heterojunction bipolar-transistors;Kurishima;Jpn J Appl Phys Part 2 – Lett,1992

5. Photocurrent spectroscopy of 5-nm-wide InGaAs/InAlAs quantum-wells and quadratic dependence of optical-transition energies on quantum numbers;Kotera;J Appl Phys,1995

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