Interfaces and defects of high-K oxides on silicon
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference74 articles.
1. High-κ gate dielectrics: Current status and materials properties considerations
2. Thermodynamic stability of binary oxides in contact with silicon
3. Structure and stability of ultrathin zirconium oxide layers on Si(001)
4. Band offsets of wide-band-gap oxides and implications for future electronic devices
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