Vertical GaN diode BV maximization through rapid TCAD simulation and ML-enabled surrogate model

Author:

Lu Albert,Marshall Jordan,Wang Yifan,Xiao Ming,Zhang Yuhao,Wong Hiu Yung

Funder

National Science Foundation

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. GaN FinFETs and trigate devices for power and RF applications: review and perspective;Zhang;Semicond. Sci. Technol.,2021

2. (Ultra)Wide-Bandgap Vertical Power FinFETs;Zhang;IEEE Trans Electron Devices,2020

3. Recent development of vertical GaN power devices;Oka;Jpn. J. Appl. Phys.,2019

4. Guard ring assisted RESURF: a new termination structure providing stable and high breakdown voltage for SiC power devices;Kinoshita,2002

5. High voltage, high current GaN-on-GaN p-n diodes with partially compensated edge termination;Wang;Appl. Phys. Lett.,2018

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1. Automatic TCAD Model Parameter Calibration using Autoencoder;2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2023-09-27

2. Device Image-IV Mapping using Variational Autoencoder for Inverse Design and Forward Prediction;2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2023-09-27

3. Physics-Integrated Machine Learning for Efficient Design and Optimization of a Nanoscale Carbon Nanotube Field-Effect Transistor;ECS Journal of Solid State Science and Technology;2023-09-01

4. Rapid Inverse Design of GaN-on-GaN Diode with Guard Ring Termination for BV and (VFQ)−1 Co-Optimization;2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD);2023-05-28

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