Quality control planning to prevent excessive scrap production

Author:

Bettayeb B.ORCID,Bassetto S.J.,Sahnoun M.

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Hardware and Architecture,Software,Control and Systems Engineering

Reference33 articles.

1. Variation reduction in a wafer fabrication line through inspection optimization;Bean,1997

2. Quality and exposure control in semiconductor manufacturing part i: modelling;Bettayeb;International Journal of Production Research,2011

3. Optimized design of control plans based on risk exposure and resources capabilities;Bettayeb,2010

4. Economic design of the VSSI control charts for correlated data;Chen;International Journal of Production Economics,2007

5. Integrated analysis of quality and production logistics performance in asynchronous manufacturing lines;Colledani,2008

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