Personalized feature extraction for manufacturing process signature characterization and anomaly detection
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Published:2024-06
Issue:
Volume:74
Page:435-448
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ISSN:0278-6125
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Container-title:Journal of Manufacturing Systems
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language:en
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Short-container-title:Journal of Manufacturing Systems
Author:
Shi Naichen,
Guo ShenghanORCID,
Al Kontar RaedORCID
Cited by
1 articles.
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