Author:
Versluys J.,Clauws P.,Nollet P.,Degrave S.,Burgelman M.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. D. Bonnet, M. Harr, in: J. Schmid, H.A. Ossenbrink, P. Helm, H. Ehmann, E.D. Dunlop (Eds.), Proceedings of the Second World Conference on Photovoltaic Solar Energy Conversion, Vienna, Austria, July 6–10, 1998, p. 397
2. V. Komin, V. Viswanathan, B. Tetali, D.L. Morel, C.S. Ferekides, in: Proceedings of the 29th IEEE Photovoltaic Specialists Conference, PVSC, 2002, p. 736–739
3. Deep Level Transient Fourier Spectroscopy (DLTFS)—A technique for the analysis of deep level properties
4. P. Nollet, M. Burgelman, S. Degrave, J. Beier, in: Proceedings of the 29th IEEE Photovoltaic Specialists Conference, PVSC, 2002, p. 704–707
5. Semiconductor Material and Device Characterization;Schroder,1998
Cited by
35 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献