Author:
Barradas N.P.,Jeynes C.,Jenkin M.,Marriott P.K.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Cited by
33 articles.
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1. Amorphous carbon thin films: Mechanisms of hydrogen incorporation
during magnetron sputtering and consequences for the secondary electron
emission;Journal of Vacuum Science & Technology A;2023-06-23
2. Bias and synergy in the self-consistent approach of data analysis of ion beam techniques;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2022-12
3. On the accuracy of Total-IBA;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-02
4. Reference-free evaluation of thin films mass thickness and composition through energy dispersive X-ray spectroscopy;Materials Characterization;2019-07
5. Bayesian data analysis tools for atomic physics;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-10