Study of thin film multilayers using X-ray reflectivity and scanning probe microscopy
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference8 articles.
1. Surface Studies of Solids by Total Reflection of X-Rays
2. Extraction of density profile for near perfect multilayers
3. Study of interdiffusion in thin Fe film deposited on Si(111) by x-ray reflectivity and secondary ion mass spectrometry
4. Fourier Reconstruction of Density Profiles of Thin Films Using Anomalous X-Ray Reflectivity
5. X-ray-reflectivity study of Ge-Si-Ge films
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