Monte Carlo simulation of kinetic electron emission induced by MeV He+ and He++ ions incident on polycrystalline aluminium
Author:
Publisher
Elsevier BV
Subject
Applied Mathematics,Modelling and Simulation,Numerical Analysis,General Computer Science,Theoretical Computer Science
Reference39 articles.
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3. Ion-by-ion measurements of backward secondary electron emission of carbon foilsunder the impact of MeVH+,H0,H−, andH2+projectiles
4. Backward- and forward-electron-emission measurements for MeVH0projectiles incident on thin carbon foils: Correlation with the charge state of the emergent projectile
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