Photoelectron spectroscopy study of U–Ni alloys: a comparison of thin films and bulk systems-Reference-Cited by-同舟云学术

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Photoelectron spectroscopy study of U–Ni alloys: a comparison of thin films and bulk systems

Published:2002-04 Issue: Volume:504 Page:83-92
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Black L.,Gouder T.,Wastin F.,Rebizant J.,Havela L.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference25 articles.

1. Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline Targets

2. Thin Film Processes;Vossen,1978

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Peculiarities of U-based Laves phases;IOP Conference Series: Materials Science and Engineering;2010-03-01

2. Electronic States of UNi2from Photoemission Spectroscopy;Acta Physica Polonica A;2008-01

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