Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Reference47 articles.
1. NBTI-Related variability impact on 14-nm node FinFET SRAM performance and static power: correlation to time zero fluctuations;Mishra;IEEE Trans. Electron. Dev.,2018
2. Technology scaling on high-K & metal-gate FinFET BTI reliability;Taek Lee,2013
3. Intrinsic transistor reliability improvements from 22nm tri-gate technology;Ramey,2013
4. A comprehensive model for PMOS NBTI degradation: recent progress, Microelectron;Alam;Reliab,2007
5. Negative bias temperature instability: what do we understand?;Schroder;Microelectron. Reliab.,2007
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