A fast test compaction method using dedicated Pure MaxSAT solver embedded in DFT flow
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Published:2025-01
Issue:
Volume:100
Page:102265
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ISSN:0167-9260
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Container-title:Integration
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language:en
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Short-container-title:Integration
Author:
Chao ZhitengORCID, Zhang Xindi, Huang Junying, Liu Zizhen, Zhao Yixuan, Ye Jing, Cai Shaowei, Li Huawei, Li Xiaowei
Reference28 articles.
1. New techniques for deterministic test pattern generation;Hamzaoglu;J. Electron. Test.,1999 2. SOCRATES: A highly efficient automatic test pattern generation system;Schulz;IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.,1988 3. Ang Ghim Boon, Chan Choon Kit, Chua Kok Keng, Oh Chong Khiam, TetraMax diagnosis and laker software on failure analysis for ATPG/scan failures, in: 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2006, pp. 217–221. 4. Survey of test vector compression techniques;Touba;IEEE Des. Test Comput.,2006 5. N. Sitchinava, E. Gizdarski, S. Samaranayake, F. Neuveux, R. Kapur, T.W. Williams, Changing the scan enable during shift, in: 22nd IEEE VLSI Test Symposium, 2004. Proceedings, 2004, pp. 73–78.
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