How to measure atomic diffusion processes in the sub-nanometer range-Reference-Cited by-同舟云学术

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How to measure atomic diffusion processes in the sub-nanometer range

Published:2008-02 Issue:3 Volume:56 Page:464-470
ISSN:1359-6454
Container-title:Acta Materialia
language:en
Short-container-title:Acta Materialia

Author:

Schmidt H.,Gupta M.,Gutberlet T.,Stahn J.,Bruns M.

Publisher

Elsevier BV

Subject

Metals and Alloys,Polymers and Plastics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. Deforming Nanocrystalline Metals: New Insights, New Puzzles

2. Interface controlled diffusional creep

3. Grain-Growth Kinetics of Nanocrystalline Iron Studied In Situ by Synchrotron Real-Time X-ray Diffraction

4. Grain Nucleation and Growth During Phase Transformations

5. Morphology and oxidation kinetics of SiO2layers on silicon

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1. Grain size effect on precipitation behavior of nanostructured Inconel 718;Journal of Materials Science & Technology;2024-12

2. Self-Diffusion of Ge in Amorphous Ge_xSi_1–x Films Studied In Situ by Neutron Reflectometry;ACS Materials Au;2024-07-23

3. Study of Interdiffusion and Magnetization of Cu-Doped Fe/Ni Multilayers;Journal of Superconductivity and Novel Magnetism;2024-07-17

4. Analysis of the Diffusion in a Multilayer Structure under a Constant Heating Rate: The Calculation of Activation Energy from the In Situ Neutron Reflectometry Measurement;ACS Omega;2023-07-21

5. Effect of thermal annealing on structure and magnetic properties in a Ni–Cr multilayer;International Journal of Materials Research;2023-04-01

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