The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction-Reference-Cited by-同舟云学术

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The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction

Published:2017-03 Issue: Volume:126 Page:36-43
ISSN:1359-6454
Container-title:Acta Materialia
language:en
Short-container-title:Acta Materialia

Author:

Fancher C.M.,Brewer S.,Chung C.C.,Röhrig S.,Rojac T.,Esteves G.,Deluca M.,Bassiri-Gharb N.,Jones J.L.

Funder

National Science Foundation

Federal Ministry for Transport, Innovation and Technology

Austrian Science Fund

DOE Office of Science by Argonne National Laboratory

Publisher

Elsevier BV

Subject

Metals and Alloys,Polymers and Plastics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference40 articles.

1. Ferroelectric materials for electromechanical transducer applications;Cross;Mater. Chem. Phys.,1996

2. Resolving structural contributions to the electric-field-induced strain in lead-free (1−x)Ba(Zr0.2Ti0.8)O3−x(Ba0.7Ca0.3)TiO3 piezoceramics;Ehmke;Acta Mater.,2014

3. Electric-field-induced phase-change behavior in (Bi0.5Na0.5)TiO3–BaTiO3–(K0.5Na0.5)NbO3: a combinatorial investigation;Daniels;Acta Mater.,2010

4. Direct measurement of the domain switching contribution to the dynamic piezoelectric response in ferroelectric ceramics;Jones;Appl. Phys. Lett.,2006

5. Domain wall displacement is the origin of superior permittivity and piezoelectricity in BaTiO3 at intermediate grain sizes;Ghosh;Adv. Funct. Mater.,2014

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