MnxGe1−x thin layers studied by TEM, X-ray absorption spectroscopy and SQUID magnetometry-Reference-Cited by-同舟云学术

MnxGe1−x thin layers studied by TEM, X-ray absorption spectroscopy and SQUID magnetometry

Published:2007-07 Issue:13 Volume:601 Page:2628-2631
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

De Padova P.,Ayoub J.-P.,Berbezier I.,Mariot J.-M.,Taleb-Ibrahimi A.,Richter M.C.,Heckmann O.,Testa A.M.,Fiorani D.,Olivieri B.,Picozzi S.,Hricovini K.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference17 articles.

1. Spintronics: A Spin-Based Electronics Vision for the Future

2. Zener Model Description of Ferromagnetism in Zinc-Blende Magnetic Semiconductors

3. A Group-IV Ferromagnetic Semiconductor: Mn x Ge 1− x

4. Structural and magnetic properties of Mn5Ge3 clusters in a dilute magnetic germanium matrix

5. Spatial Chemical Inhomogeneity and Local Electronic Structure of Mn-Doped Ge Ferromagnetic Semiconductors

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