Author:
Bastin G.F.,van Loo F.J.J.,Vosters P.J.C.,Vrolijk J.W.G.A.
Subject
Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
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2. F. Maurice, R. Seguin, J. Henoc; IVeCongrès International sur l'Optique Des Rayons X et la Microanalyse, Orsay (Septembre 1965).
3. J. Henoc, F. Maurice and A. Zemskoff, Vth Int. Congr. on X-Ray Optics and Microanalysis, Tübingen (1968).
4. A correction procedure for characteristic fluorescence encountered in microprobe analysis near phase boundaries
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