Background correction in atomic emission spectrometry using repetitive harmonic wavelength scanning and applying Fourier analysis

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Background correction in atomic emission spectrometry using repetitive harmonic wavelength scanning and applying Fourier analysis—I. Theory

Published:1995-07 Issue:8 Volume:50 Page:823-835
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Matthee T.,Visser K.

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference28 articles.

1. The problem of spectral interferences and line selection in plasma emission spectrometry;Zander,1987

2. Background and background correction in analytical atomic spectrometry. Part 1. Emission spectrometry. A tutorial review

3. The Shape of Spectral Lines: Tables of the Voigt Profile

4. Fourier Analysis;Hsu,1970

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1. References;ICP Emission Spectrometry;2021-04-30

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3. Chemometrics;Analytical Chemistry;1996-01-01

4. Atomic Spectrometry Updates—References;J. Anal. At. Spectrom.;1995

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