Electron moiré method and its application to micro-deformation measurement

Author:

Kishimoto Satoshi,Huimin Xie,Shinya Norio

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. Moiré Fringe in Strain Analysis;Theocaris,1969

2. High Sensitivity Moiré;Post,1994

3. Kanson WF, Sutton MA, Peter WH. Holographic and laser speckle interferometry. In: Kabayashi, editor. Handbook on Experimental Mechanics. 2nd ed., New York: VCH publishers, Inc., 1993. [Chapter 8].

4. Micro-creep deformation measurement by a moire method using electron beam lithography and electron beam scan;Kishimoto;Opt Engng,1993

5. Electron beam moiré study of fracture of a glass fiber reinforced plastic composite;Read;Trans ASME,1994

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