Some aspects of error bounds in feature selection

Author:

Boekee D.E.,van der Lubbe J.C.A.

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Vision and Pattern Recognition,Signal Processing,Software

Reference17 articles.

1. Statistical Pattern Recognition;Chen,1973

2. On information and distance measures, error bounds, and feature selection;Chen;Inf. Sci.,1976

3. On a new class of bounds on Bayes risk in multihypothesis pattern recognition;Devijver;IEEE Trans. Comput. C-23,1974

4. On the dissimilarity of probability measures;Gyorfi,1975

5. The divergence and Bhattacharyya distance in signal selection;Kailath;IEEE Trans. Commn. Tech. COM-15,1967

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