IBIC analysis of SiC detectors developed for fusion applications-Reference-Cited by-同舟云学术

IBIC analysis of SiC detectors developed for fusion applications

Published:2020-12 Issue: Volume:177 Page:109100
ISSN:0969-806X
Container-title:Radiation Physics and Chemistry
language:en
Short-container-title:Radiation Physics and Chemistry

Author:

Jiménez-Ramos M.C.,López J. García,Osuna A. García,Rodríguez-Ramos M.,Barroso A. Villalpando,Muñoz M. García,Andrade E.,Pellegrini G.,Ugobono S. Otero,Godignon P.,Rafí J.M.,Rius G.

Funder

Spanish Ministry of Economy and Competiveness

Spanish Ministry of Science, Innovation, and Universities

EUROfusion Project

PASPA-UNAM

Publisher

Elsevier BV

Subject

Radiation

Reference25 articles.

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2. A review of ion beam induced charge microscopy;Breese;Nucl. Instrum. Methods B,2007

3. Study of charge collection efficiency in 4H–SiC Schottky diodes with 12C ions;de Napoli;Nucl. Instrum. Methods A,2009

4. Chapter 5: physics of energetic ions;Fasoli;Nucl. Fusion,2007

5. Charge collection efficiency degradation on Si diodes irradiated with high energy protons;Garcia Lopez;Nucl. Instrum. Methods B,2014

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