Kinetic study of group IV nanoparticles ion beam synthesized in SiO2-Reference-Cited by-同舟云学术

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Kinetic study of group IV nanoparticles ion beam synthesized in SiO2

Published:2001-05 Issue:1-4 Volume:178 Page:17-24
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Bonafos C.,Colombeau B.,Altibelli A.,Carrada M.,Ben Assayag G.,Garrido B.,López M.,Pérez-Rodrı́guez A.,Morante J.R.,Claverie A.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference23 articles.

1. Visible photoluminescence related to Si precipitates in Si+-implanted SiO2

2. Annealing effects in light-emitting Si nanostructures formed in SiO2 by ion implantation and transient preheating

3. Tuning the emission wavelength of Si nanocrystals in SiO2 by oxidation

4. Multimodal impurity redistribution and nanocluster formation in Ge implanted silicon dioxide films

5. Strong blue and violet photoluminescence and electroluminescence from germanium-implanted and silicon-implanted silicon-dioxide layers

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1. Percolation threshold in annealed ultrathin SiO_x films by 2D Monte Carlo simulations;CrystEngComm;2024

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3. Crystallization Behavior of Amorphous Si Nanoinclusions Embedded in Silicon Oxide Matrix;physica status solidi (a);2019-12-17

4. Effects of surface functionalization and polymerization on anode characteristics of plasma-synthesized silicon nanocrystal active materials for lithium ion battery anode;Journal of Industrial and Engineering Chemistry;2019-12

5. Atomic-Scale Characterization of N-Doped Si Nanocrystals Embedded in SiO2 by Atom Probe Tomography;The Journal of Physical Chemistry C;2019-03-11

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