Author:
Vittone E,Fizzotti F,Mirri K,Gargioni E,Polesello P,LoGiudice A,Manfredotti C,Galassini S,Rossi P,Vanni P,Nava F
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
8 articles.
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1. Semiconductor Characterization by Scanning Ion Beam Induced Charge (IBIC) Microscopy;ISRN Materials Science;2013-01-17
2. Performance of CdTe detector in the 13–1333keV energy range;Radiation Physics and Chemistry;2010-11
3. GaAs X-ray detector characterization through a 3D finite element model;Journal of Computational Electronics;2006-03
4. SiC detectors for neutron monitoring;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2005-10
5. Digital IBIC—new spectroscopic modalities for ion-beam-induced charge imaging;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2004-04