Low energy ion backscattering spectrometry of multi-layer targets

Author:

Klatt Ch.,Kalbitzer S.,Konac G.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference12 articles.

1. G. Konac. S. Kalbitzer, Ch.Klatt, D. Niemann, R. Stoll, these proceedings.

2. Energy loss and straggling of MeV 4He ions in a Si/Sb multilayer target

3. Stopping power measurements of 1H, 4He and 14N in Si in the energy range of 0.02–1 MeV/amu

4. E. Friedland, M. Hayes, S. Kalbitzer, C. Klatt, G. Konac, C. Langpape, these proceedings.

5. A 3-MV Pelletron for materials research at Heidelberg

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1. Further improved technique for channeled stopping power measurements;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2014-08

2. Non-destructive quantitative analysis of the Ge concentration in SiGe quantum wells by means of low energy RBS;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-11

3. Improved stoichiometry measurements using 4He elastic backscattering: experiment and simulation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-05

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