1. Crystal Defect Study in III-V Compound Technology
2. A.M. Huber, C. Grattepain and P. Collot, Proc. of the Internat. Conf. on Defect Control in Semiconductors. Yokohama, Japan 91989) Ed. North Holland p. 1523.
3. Proc. of the 1st International Conf. on Epitaxial Crystal Growth;Huber,1990
4. Crystal quality problems of epitaxial layer growth on InP;Huber,1993
5. Submicron optical sectioning microscopy: A particular inverse problem solution adapted to epilayer defect analysis