Modeling the charge density profile in thin film devices using SIMS profiling data-Reference-Cited by-同舟云学术

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Modeling the charge density profile in thin film devices using SIMS profiling data

Published:2016-12 Issue: Volume:100 Page:9-13
ISSN:0749-6036
Container-title:Superlattices and Microstructures
language:en
Short-container-title:Superlattices and Microstructures

Author:

Abdollahi Naeim,Gorji Nima E.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science

Reference17 articles.

1. CdTe single-crystal heterojunction photovoltaic cells;Duenow,2014

2. Phosphorus doping of polycrystalline CdTe by diffusion;Colegrove,2015

3. Cu profiles in CdTe solar cells;Moore,2015

4. Correlative impurity distribution analysis in cadmium telluride (CdTe) thin-film solar cells by ToF-SIMS2D imaging;Mao;Sol. Energy Mater. Sol. Cells,2016

5. Cu migration and its impact on the metastable behavior of CdTe solar cells;Guo,2015

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. SnO2 interlayer effects on the inverted polymer solar cells;Chemical Physics Letters;2020-02

2. Roll-over behavior in current-voltage curve introduced by an energy barrier at the front contact in thin film CdTe solar cell;Solar Energy;2018-05

3. Vacuum and Liquid-Phase Processing of ZnSe Buffer-Layer for Chalcopyrite Absorber Based Photovoltaic Technology;ECS Journal of Solid State Science and Technology;2018

4. Defect interactions and the role of complexes in the CdTe solar cell absorber;Journal of Materials Chemistry A;2017

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